can you please me,Exercise 5.11 from page 328 of the textbook (except, do not compute the aliasing probability)5.11 (Ones Count Testing versus Transition Count Testing) Assume a faultfree output response R 0 = 01101111 and a faulty response R 1 00110001 . Compute the ones-count and transition-count signatures; indicate which compaction scheme can detect the faulty response, and show the aliasing probability using either compaction scheme.Consider an external LFSR with characteristic polynomial: f(x) = 1 + x + x4 Draw the circuit, write the matrix equation, and show an example pattern sequence for this LFSR Draw a transistor-level diagram of a four-input NOR gate. Give an example input sequence required to detect a stuck-open fault in one of the NOR gate’s PMOS transistors. Give an example input sequence required to detect a stuck-open fault in one of the NOR gate’s NMOS transistors.
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